author          = {Jurryt Pietersma and Arjan J.C. van Gemund and Andre Bos},
	title           = {A Model-Based Approach to Fault Diagnosis of Embedded Systems},
	journal         = {XOOTIC magazine},
	year            = {2005},
	month           = {December},
	volume          = {11},
	number          = {2},
	pages           = {25-34},
	note            = {reprint},
	abstract        = {The problems that arise from the integration of subsystems into complex, multidisciplinary embedded systems, are a potential obstruction for the expected, exponential growth in embedded systems applications. Faults that occur because of the dynamic behavior of the integrated system are difficult to trace back to individual subsystems or components. The Model-Based Diagnosis (MBD) methodology offers a solution for the fault diagnosis of the integrated system by inferring the health of a system from a compositional system model and real-world measurements. In this article we present the initial results of our MBD research as applied on the lithography systems of ASML. We explain our methodology based on a modelling language LYDIA which is specifically being developed for the purpose of MBD. Furthermore we discuss the results of our first diagnosis test case.},
	url             = {http://www.xootic.nl/magazine/dec-2005/pietersmagemundbos.pdf},
	project         = {Tangram},
	topic           = {Model-Based Diagnosis},
	group           = {SE}